- Voltage, current, power measuring instruments
- Oscilloscopes
- Spectrum analyzers
- Network analyzers
- Options for spectrum analyzers and network analyzers
- Logic analyzers ・ FFT analyzers
- Protocol analyzers
- Options for logic analyzers and protocol analyzers
- Microprocessor development related equipment
- Lock-in amplifiers
- Measuring instruments and peripheral devices for audio ・ video equipments
- Oscillators ・ signal generators
- Receivers
- Frequency ・ time measuring instruments
- Power supplies / Electronic load devices
- Electrical safety testers / measuring instruments
- Recording meters ・ Data loggers ・ Recorders
- Circuit ・ Element ・ Parts evaluation measuring instruments
- EMC・EMI Related
- Optical related measuring instruments
- Sound ・ Vibration related
- Thermometers ・ Hygrometers
- Thermographies ・ Radiation thermometers
- Tacometers ・ Stroboscopes
- Displacement meters
- Pressure meters
- Anemometers
- Strain meters
- Film thickness measuring devices
- Dosimeters (γ-ray, X-ray, α-ray, β-ray, etc.)
- Color ・ Brightness ・ Illuminance related measuring instruments
- PC base mesuring board related
- Training devices for education
- Other electronic measuring instruments
- Moisture measuring equipments
- Density ・ specific gravity measuring equipments
- Viscosity ・ Viscoelastic measuring equipments
- Specific surface areas ・ Pore distribution measuring equipments
- Particle diameter ・ Particle size distribution measuring equipments
- Hardness meters
- Surface tension meters ・ Contact angle meters
- Dryers ・ Electric furnaces
- Stirring ・ Defoarming ・ Mills
- Distillation ・ Refining equipment
- Preprocessing equipments for observation and analysis
- Balances
- Laboratory equipments
- Apparatus ・ Accessories and Consumables
- Ultraviolet-visible near infrared spectrophotometers
- Spectro fluorophotometers
- Fourier transform infrared spectrophotometers
- Raman spectrophotometers
- ICP emission analyzing devices and atomic absorption spectrophotometers
- Emission analyzing devices
- X-rayanalyzing devices
- Fluorescence X-rays analyzers
- Gas ・ Liquid chromatographs
- Mass spectrographs
- Thermal analysis equipments
- Odor analyzers
- Water quality measuring devices
- Gas analyzers
- Other science instruments/Analysis equipments
- Cleanrooms ・ Booths
- Temperature & Humidity chambers
- Material testing devices
- Vibration and shock testing devices
- Drop testing devices
- Combined testing devices
- Durability testing devices
- Tensile ・ compression testing machines
- Light fastness testers
- Corrosion testing devices
- Charge and discharge testing devices
- Cleanrooms ・ Booths
- EMC / EMI Radio Wave Anechoic Chambers
- Shield Rooms
- Anechoic Chambers
- Other Environment ・ Evaluation ・ Testing devices
- Clearnrooms・Booths
- PCs and related products
- Network related products
- External Storage Device
- Extension Board
- Printer/Plotter
- CAD/CAM Systems
- Structural Analysis Software
- Heat Conduction Analysis Software
- Thermal-Hydraulic Analysis Software
- Electromagnetic Fields Analysis Software
- Image Process / Analysis Software
- Systems / Numerical Analysis Software
- Software Development Tools
- PCB Development Tools
- Automated Measuring Tools
- Industrial robots
- Mounting machine related
- Jointing devices
- Machine tools
- Processors
- Manufacturing equipments
- Painting equipments
- Conveyers
- Marking
- Industrial computer related
- Tools
- Manufacturing ・ Processing ・ Inspection equipments
- 3D printers・3D scanners
- Control related products
- Clearnrooms・Booths
- Optical microscopes
- Digital microscopes
- Probe microscopes
- Laser microscopes
- Electron microscopes (SEM ・ TEM)
- Focused ion beam (FIB)
- CCD cameras
- High-speed cameras
- Endoscopes
- Roughness meters
- 3D measuring devices (white interferometer ・ distance meter)
- Light source and lighting equipments
- Optical instruments
- X-ray fluoroscopic equipments
- Ultrasonic imaging equipments
- Other nondestructive inspection equipment
- Image inspecting ・ processing equipments
- Measuring tools
- Other imaging measurements ・ Surface observation
