In I-V characteristic test on devices that generate heat when current flows, applying pulse current is effective for avoiding the influence of the self-heating. By using the current pulse sweep function and voltage measurement in synchronous with pulses, precise VF characteristic test with large current is available.
The 6247C/6247G is capable of ISVM (current source voltage measurement) and VSIM (voltage source current measurement). Diode I-V characteristics are measured by ISVM. In addition, micro leak current up to 10 pA can be measured by applying reverse voltage to diodes by VSIM. Also, automatic PASS/FAIL judgment is available by using comparison operation of the measurement calculating function.