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Products
The products listed here are for overseas markets, not for Japan domestic.
- Electronic Measuring Instruments
- Impedance Analyzer
- LCR Meter
- HIOKI Impedance Analyzer IM7587
1 MHz to 3 GHz Measurement Frequency Impedance Analyzer with 0.5 ms Test Speed and 0.07% Variability
Hioki LCR Meters and Impedance Analyzers range from 1 mHz to 3 GHz devices to suit a wide range of applications in the testing of electronic components. The IM7587 Impedance Analyzer offers a top measurement time of 0.5 ms over a 1 MHz to 3 GHz frequency range and superior stability, making it ideal for R&D as well as high volume production of ferrite chip beads and chip inductors.
Impedance Analyzer
Model:
IM7587
Maker:
HIOKI E.E. Corporation
Features
- 1 MHz to 3 GHz testing source frequency
- Fastest test speed of 0.5 msec (Analog measurement time)
- 0.07% measured value variability (When measuring a 1 nH coil at 3 GHz)
- ±0.65% rdg. basic accuracy
- RF I-V method
- Half-rack size body and palm-sized test head
- Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
- Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode
Line up
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IMPEDANCE ANALYZER IM7580A
Measurement frequency: 1 MHz to 300 MHz
Basic accuracy: Z ±0.72% rdg., θ 0.41° -
IMPEDANCE ANALYZER IM7581
Measurement frequency: 100 kHz to 300 MHz
Basic accuracy: Z ±0.72% rdg., θ 0.41° -
IMPEDANCE ANALYZER IM7583
Measurement frequency: 1 MHz to 600 MHz
Basic accuracy: Z ±0.65% rdg., θ 0.38° -
IMPEDANCE ANALYZER IM7585
Measurement frequency: 1 MHz to 1.3 GHz
Basic accuracy: Z ±0.65% rdg., θ 0.38° -
IMPEDANCE ANALYZER IM7587
Measurement frequency: 1 MHz to 3 GHz
Basic accuracy: Z ±0.65% rdg., θ 0.38°
Videos
Specifications
Accuracy guaranteed for 1 year
| Measurement modes | LCR mode, Analyzer mode (Sweeps with measurement frequency and measurement level), Continuous measurement mode |
|---|---|
| Measurement parameters | Z, Y, θ, Rs (ESR), Rp, X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q |
| Measurable range | 100 mΩ to 5 kΩ |
| Display range |
Z: 0.00 m to 9.99999 GΩ / Rs, Rp, X: ± (0.00 m to 9.99999 GΩ) Ls, Lp: ± (0.00000 n to 9.99999 GH) / Q: ± (0.00 to 9999.99) θ: ± (0.000° to 180.000°), Cs, Cp: ± (0.00000 p to 9.99999 GF) D: ± (0.00000 to 9.99999), Y: (0.000 n to 9.99999 GS) G, B: ± (0.000 n to 9.99999 GS), Δ%: ± (0.000 % to 999.999 %) |
| Basic accuracy | Z: ±0.65 % rdg. θ: ±0.38° |
| Measurement frequency | 1 MHz to 3 GHz (100 kHz setting resolution) |
| Measurement signal level |
Power: -40.0 dBm to +1.0 dBm Voltage: 4 mV to 502 mVrms Current: 0.09 mA to 10.04 mArms |
| Output impedance | 50 Ω (at 10 MHz) |
| Display | 8.4-inch color TFT with touch screen |
| Measurement speeds | FAST: 0.5 ms (Analog measurement time, typical value) |
| Functions |
Contact check, Comparator, BIN measurement (classification), Panel loading/saving, Memory function, Equivalent circuit analysis, Correlation compensation |
| Interfaces |
EXT I/O (Handler), USB communication, USB memory, LAN, RS-232C (optional), GP-IB (optional) |
| Power supply | 100 to 240 V AC, 50/60 Hz, 70 VA max. |
| Dimensions and mass |
Main unit: 215 mm (8.46 in) W × 200 mm (7.87 in) H × 348 mm (13.70 in) D, 8.0 kg (282.2 oz) Test head: 90 mm (3.54 in) W × 64 mm (2.52 in) H × 24 mm (0.94 in) D, 300 g (10.58 oz) |
| Included accessories | Test head ×1, Connection cable ×1, Instruction manual ×1, Power cord ×1 |
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