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Products
The products listed here are for overseas markets, not for Japan domestic.
- Electronic Measuring Instruments
- Impedance Analyzer
- LCR Meter
- HIOKI Impedance Analyzer IM7580A
1 MHz to 300 MHz Measurement Frequency Impedance Analyzer with 0.5 ms Test Speed and Superior Repeatability
Hioki LCR Meters and Impedance Analyzers range from 1 mHz to 3 GHz devices to suit a wide range of applications in the testing of electronic components. The IM7580A impedance analyzer offers a top measurement time of 0.5 ms over a 1 MHz to 300 MHz frequency, and both LCR and Analyzer Modes to meet applications for both high volume production inspections and research and development.
Impedance Analyzer
Model:
IM7580A
Maker:
HIOKI E.E. Corporation
Features
- 1 MHz to 300 MHz testing source frequency
- Fastest test speed of 0.5 msec
- ±0.72% rdg. basic accuracy
- Half-rack size body and palm-sized test head
- Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
- Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode
- RF I-V method
Line up
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Impedance Analyzer IM7580A
Measurement frequency: 1 MHz to 300 MHz
Basic accuracy: Z ±0.72% rdg., θ 0.41° -
Impedance Analyzer IM7581
Measurement frequency: 100 kHz to 300 MHz
Basic accuracy: Z ±0.72% rdg., θ 0.41° -
Impedance Analyzer IM7583
Measurement frequency: 1 MHz to 600 MHz
Basic accuracy: Z ±0.65% rdg., θ 0.38° -
Impedance Analyzer IM7585
Measurement frequency: 1 MHz to 1.3 GHz
Basic accuracy: Z ±0.65% rdg., θ 0.38° -
Impedance Analyzer IM7587
Measurement frequency: 1 MHz to 3 GHz
Basic accuracy: Z ±0.65% rdg., θ 0.38°
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Videos
Specifications
Accuracy guaranteed for 1 year
| Measurement modes | LCR mode, Analyzer mode (Sweeps with measurement frequency and measurement level), Continuous measurement mode |
|---|---|
| Measurement parameters | Z, Y, θ, Rs (ESR), Rp, X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q |
| Measurable range | 100 mΩ to 5 kΩ |
| Display range |
Z: 0.00 m to 9.99999 GΩ / Rs, Rp, X: ± (0.00 m to 9.99999 GΩ) Ls, Lp: ± (0.00000 n to 9.99999 GH) / Q: ± (0.00 to 9999.99) θ: ± (0.000° to 180.000°), Cs, Cp: ± (0.00000 p to 9.99999 GF) D: ± (0.00000 to 9.99999), Y: (0.000 n to 9.99999 GS) G, B: ± (0.000 n to 9.99999 GS), Δ%: ± (0.000 % to 999.999 %) |
| Basic accuracy | Z: ±0.72% rdg. θ: ±0.41° |
| Measurement frequency | 1.0000 MHz to 300.00 MHz (5 digits resolution) |
| Measurement signal level |
Power: -40.0 dBm to +7.0 dBm Voltage: 4 mV to 1001 mVrms Current: 0.09 mA to 20.02 mArms |
| Output impedance | 50 Ω |
| Display | 8.4-inch color TFT with touch screen |
| Measurement speeds *1 | FAST: 0.5 ms (Analog measurement time, typical value) |
| Functions |
Contact check, Comparator, BIN measurement (classification), Panel loading/saving, Memory function, Equivalent circuit analysis, Correlation compensation |
| Interfaces |
EXT I/O (Handler), USB communication, USB memory, LAN, RS-232C (optional), GP-IB (optional) |
| Power supply | 100 to 240 V AC, 50/60 Hz, 70 VA max. |
| Dimensions and mass |
Main unit: 215 mm (8.46 in) W × 200 mm (7.87 in) H × 268 mm (10.55 in) D, 6.5 kg (229.3 oz) Test head: 61 mm (2.40 in) W × 55 mm (2.17 in) H × 24 mm (0.94 in) D, 175 g (6.2 oz) |
| Included accessories | Test head ×1, Connection cable ×1, Instruction manual ×1, Power cord ×1 |
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