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【CIQTEK】Field Emission Scanning Electron Microscope SEM5000X
Achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV It advantageous in advanced nano-structural materials research -
【CIQTEK】FIB Focused Ion Beam – Scanning Electron Microscope DB550
The ion column facilitates a Ga+ liquid metal ion source An all-in-one nanoscale analysis and imaging fabrication works -
【CIQTEK】High Speed Scanning Electron Microscope HEM6000
Can cover large volume specimen imaging across scales. The imaging speed can reach more than 5 times faster
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