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Products
The products listed here are for overseas markets, not for Japan domestic.
- Optical / Imaging / Precision Devices
- Electronic Microscope
- 【CIQTEK】High Speed Scanning Electron Microscope HEM6000
Can cover large volume specimen imaging across scales. The imaging speed can reach more than 5 times faster
High Speed Scanning Electron Microscope
Model:
HEM6000
Maker:
CIQTEK Co.,Ltd. (CIQTEK)
Feature
- Scanning : Dwell time 10ns/pixel, Acquisition speed 2x100M pixel/s
- Beam deflection system: Maximum 64μm at 4nm per-pixel
- Stage Deceleration Technology: Reduces incident electron voltage
- Electromagnetic & electrostatic combo: high resolution imaging
SE/BSE signal free switching, mixing with adjustable ratio - Resolution:1.5 nm@1 kV SE; 1.8 nm@1 kV BSE; 1.5 nm@15 kV BSE
- Electron gun: High brightness schottky field emission electron gun
- Maximum sample size: 4 inches in diameter
- Specimen stage-Repeatability: X：±0.6 μm；Y：±0.3 μm
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