-
【johoyd】Inverted metallurgical microscope JHX-4
Is a brand new inverted metallurgical microscope newly launched It has bright field observation, polarized light observation -
【johoyd】Metallurgical microscope JHE-4M
Is a cost-effective inverted metallurgical microscope With bright field observation, polarized light observation -
【johoyd】Image analysis metallographic microscope 4XC
Is used to identify and analyze the organization structure of various metalsalloy materials and non-metallic materials -
【Supro】Plasma Cleaner IC150
TEM sample/holder cleaning and hydrophilization treatment High-performance vacuum dry pump, oil-free and efficient -
【BESTRON】In-situ sample holder for TEM(electrical / biasing fields ) INSTEMS-ME
Able to various electrical application and high precision measurement Perfectly preserves the double-tilt function of TEM holder -
【BESTRON】In-situ sample holder for TEM( thermal/ biasing fields ) INSTEMS-TE
Is able to apply biasing, heating inside TEM Various electrical application and high precision measurement -
【BESTRON】In-situ sample holder for TEM( thermal/ mechanical fields) INSTEMS-MT
Is able to apply straining, heating inside TEM The low power required to generates negligible sample drifting -
【BESTRON】In-situ sample holder for TEM( thermal/ mechanical/electrical fields ) INSTEMS-MET
Is able to apply straining, heating and biasing inside TEM Changes of samples under heat/force/electricity can be observed in TEM -
【CHIPNOVA】Breeze Series In-Situ Holders Syetem（Optics&Heating）/ Breeze Series Syetem( Sample holder for TEM in gas environment）
Gas-environment nanolab is constructed in the in-situ sample stage -
【CHIPNOVA】Spring Series In-Situ Holders Syetem(Heating&Electrochemistry) / Spring Series System (the sample holder for TEM )
Liquid-environment nanolab is constructed in the in-situ sample stage -
【CHIPNOVA】Breeze Series In-Situ Holders (Optics&Heating for TEM gaseous in-situ) /Breze Series
Changes in light and thermal field of samples in gaseous environment Dynamic monitoring at the nanoscale and even the atomic scale -
【CHIPNOVA】Breeze Series In-Situ Holders（Heating) /Breeze Series (Heating）
An environment where the temperature can change in a gas environment Real-time and dynamic monitoring is achieved at the nano /atomic scale -
【CHIPNOVA】Spring Series In-Situ Holders（Optics) /Spring Series(Optics）
Liquid-environment nanolab is constructed in the in-situ sample stage Light is introduced as an external field condition by optical fiber -
【CHIPNOVA】Spring Series In-Situ Holders（Heating&Electrochemistry)／Spring Series (Heating&Electrochemistry)
Liquid-environment nanolab is constructed in the in-situ sample stage Dynamic monitoring of samples change with Heating-Electrochemistry -
【CHIPNOVA】Spring Series In-Situ Holders (Heating)／Spring Series (Heating)
Liquid-environment nanolab is constructed in the in-situ sample stage Dynamic monitoring of samples as they change with temperature -
【CHIPNOVA】In-Situ Holders（Electrochemistry) Spring Series
Is a liquid atmosphere nanolaboratory in an in-situ sample stage Apply electrical signals to thin layers or nano battery systems -
【CIQTEK】Field Emission Scanning Electron Microscope SEM5000X
Achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV It advantageous in advanced nano-structural materials research -
【CIQTEK】FIB Focused Ion Beam – Scanning Electron Microscope DB550
The ion column facilitates a Ga+ liquid metal ion source An all-in-one nanoscale analysis and imaging fabrication works -
【CIQTEK】High Speed Scanning Electron Microscope HEM6000
Can cover large volume specimen imaging across scales. The imaging speed can reach more than 5 times faster -
【Shenzhen Kingcable Automation Testing(KINGCABLE)】PIN & Appearance Inspection Equipment KC2104
Equipment testing time is within 40 seconds Equipment failure rate <0.1% , instrument precision ±0.01mm -
【Shenzhen Zhuomao Technology（Seamark）】Small precision micro focal spot X-ray online detection machine XL5800
It is capable of online automatic feeding, automatic detection automatic sorting, punching or labeling of defective products
ITEMLIST
Products Infomation
CONTENTS：
Optical / Imaging / Precision Devices
- 1
- 2
