-
【johoyd】Inverted metallurgical microscope JHX-4
Is a brand new inverted metallurgical microscope newly launched It has bright field observation, polarized light observation -
【johoyd】Metallurgical microscope JHE-4M
Is a cost-effective inverted metallurgical microscope With bright field observation, polarized light observation -
【johoyd】Image analysis metallographic microscope 4XC
Is used to identify and analyze the organization structure of various metalsalloy materials and non-metallic materials -
【Supro】Plasma Cleaner IC150
TEM sample/holder cleaning and hydrophilization treatment High-performance vacuum dry pump, oil-free and efficient -
【BESTRON】In-situ sample holder for TEM(electrical / biasing fields ) INSTEMS-ME
Able to various electrical application and high precision measurement Perfectly preserves the double-tilt function of TEM holder -
【BESTRON】In-situ sample holder for TEM( thermal/ biasing fields ) INSTEMS-TE
Is able to apply biasing, heating inside TEM Various electrical application and high precision measurement -
【BESTRON】In-situ sample holder for TEM( thermal/ mechanical fields) INSTEMS-MT
Is able to apply straining, heating inside TEM The low power required to generates negligible sample drifting -
【BESTRON】In-situ sample holder for TEM( thermal/ mechanical/electrical fields ) INSTEMS-MET
Is able to apply straining, heating and biasing inside TEM Changes of samples under heat/force/electricity can be observed in TEM -
【CHIPNOVA】Breeze Series In-Situ Holders Syetem（Optics&Heating）/ Breeze Series Syetem( Sample holder for TEM in gas environment）
Gas-environment nanolab is constructed in the in-situ sample stage -
【CHIPNOVA】Spring Series In-Situ Holders Syetem(Heating&Electrochemistry) / Spring Series System (the sample holder for TEM )
Liquid-environment nanolab is constructed in the in-situ sample stage -
【CHIPNOVA】Breeze Series In-Situ Holders (Optics&Heating for TEM gaseous in-situ) /Breze Series
Changes in light and thermal field of samples in gaseous environment Dynamic monitoring at the nanoscale and even the atomic scale -
【CHIPNOVA】Breeze Series In-Situ Holders（Heating) /Breeze Series (Heating）
An environment where the temperature can change in a gas environment Real-time and dynamic monitoring is achieved at the nano /atomic scale -
【CHIPNOVA】Spring Series In-Situ Holders（Optics) /Spring Series(Optics）
Liquid-environment nanolab is constructed in the in-situ sample stage Light is introduced as an external field condition by optical fiber -
【CHIPNOVA】Spring Series In-Situ Holders（Heating&Electrochemistry)／Spring Series (Heating&Electrochemistry)
Liquid-environment nanolab is constructed in the in-situ sample stage Dynamic monitoring of samples change with Heating-Electrochemistry -
【CHIPNOVA】Spring Series In-Situ Holders (Heating)／Spring Series (Heating)
Liquid-environment nanolab is constructed in the in-situ sample stage Dynamic monitoring of samples as they change with temperature -
【CHIPNOVA】In-Situ Holders（Electrochemistry) Spring Series
Is a liquid atmosphere nanolaboratory in an in-situ sample stage Apply electrical signals to thin layers or nano battery systems -
【CIQTEK】Field Emission Scanning Electron Microscope SEM5000X
Achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV It advantageous in advanced nano-structural materials research -
【CIQTEK】FIB Focused Ion Beam – Scanning Electron Microscope DB550
The ion column facilitates a Ga+ liquid metal ion source An all-in-one nanoscale analysis and imaging fabrication works -
【CIQTEK】High Speed Scanning Electron Microscope HEM6000
Can cover large volume specimen imaging across scales. The imaging speed can reach more than 5 times faster -
【Shenzhen Kingcable Automation Testing(KINGCABLE)】PIN & Appearance Inspection Equipment KC2104
Equipment testing time is within 40 seconds Equipment failure rate <0.1% , instrument precision ±0.01mm -
【Shenzhen Zhuomao Technology（Seamark）】Small precision micro focal spot X-ray online detection machine XL5800
It is capable of online automatic feeding, automatic detection automatic sorting, punching or labeling of defective products
Products
The products listed here are for overseas markets, not for Japan domestic.
CONTENTS：
Optical / Imaging / Precision Devices
- 1
- 2
