This website uses cookies so that we can provide you with the best user experience possible. Cookie information is stored in your browser and performs functions such as recognising you when you return to our website and helping our team to understand which sections of the website you find most interesting and useful.
ITEMLIST
Products Infomation
- Optical / Imaging / Precision Devices
- electronic microscope
- 【CIQTEK】High Speed Scanning Electron Microscope HEM6000
Can cover large volume specimen imaging across scales. The imaging speed can reach more than 5 times faster
High Speed Scanning Electron Microscope
Model:
HEM6000
Maker:
CIQTEK Co.,Ltd. (CIQTEK)
Feature
- Scanning : Dwell time 10ns/pixel, Acquisition speed 2x100M pixel/s
- Beam deflection system: Maximum 64μm at 4nm per-pixel
- Stage Deceleration Technology: Reduces incident electron voltage
- Electromagnetic & electrostatic combo: high resolution imaging
SE/BSE signal free switching, mixing with adjustable ratio - Resolution:1.5 nm@1 kV SE; 1.8 nm@1 kV BSE; 1.5 nm@15 kV BSE
- Electron gun: High brightness schottky field emission electron gun
- Maximum sample size: 4 inches in diameter
- Specimen stage-Repeatability: X：±0.6 μm；Y：±0.3 μm
To view the pdf files, the Adobe Reader from Adobe Systems is required.