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ITEMLIST
Products Infomation
- Optical / Imaging / Precision Devices
- electronic microscope
- 【CIQTEK】Field Emission Scanning Electron Microscope SEM5000X
Achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV It advantageous in advanced nano-structural materials research
Field Emission Scanning Electron Microscope (Ultra-high resolution challenges the limits)
Model:
SEM5000X
Maker:
CIQTEK Co.,Ltd. (CIQTEK)
Feature
- Objective Lens Upgrade：overall aberration was reduced by 30%
- Dual Beam Deceleration Technology：applicable to with large volumes
cross-sections, and irregular surfaces - Can have ETD，BSED，STEM，LVD，EDS/EDX, EBSD function
- Simultaneously Multi-Channel Imaging via Various Detectors
- Specifications Acceleration Voltage:：0.02 kV ~30 kV
Magnification：1 ~ 2,500,000x;
Electron Gun Type: Schottky Field Emission Electron Gun
Stage Type: 5-Axis Mechanical Eucentric Specimen Stage
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