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ITEMLIST
Products Infomation
- Optical / Imaging / Precision Devices
- electronic microscope
- 【CIQTEK】FIB Focused Ion Beam - Scanning Electron Microscope DB550
The ion column facilitates a Ga+ liquid metal ion source An all-in-one nanoscale analysis and imaging fabrication works
FIB Focused Ion Beam - Scanning Electron Microscope (Low-voltage & High-resolution)
Model:
DB550 (For nano-analysis and specimen preparation)
Maker:
CIQTEK Co.,Ltd. (CIQTEK)
Feature
- Use “Super Tunnel” electron optics column technology
- Decrease spatial charging effect, ensuring low voltage resolution
- Use electromagnetic & electrostatic compound objective lens
- Allowing fast switching amongst various imaging modes
- Water-cooled constant-temperature objective lens
- Stage Travel range: X(110mm) Y(110mm) Z(65mm) T: -10°~+70°，R: 360°
- Electron Optics Resolution: 0.9 nm@15 kV 1.6 nm@1.0 kV
- Ion Beam System Resolution : 3 nm@30 kV
- Acceleration Voltage: 20 V~30 kV(Eletron); 500 V~30 kV(Ion Beam )
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