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ITEMLIST
Products Infomation
- Optical / Imaging / Precision Devices
- In-situ sample holder for transmission electron microscopy
- 【BESTRON】In-situ sample holder for TEM(electrical / biasing fields ) INSTEMS-ME
Able to various electrical application and high precision measurement Perfectly preserves the double-tilt function of TEM holder
In-situ sample holder for TEM(electrical / biasing fields )
Model:
INSTEMS-ME
Maker:
Bestron (Beijing) Science and Technology Co.,Ltd.（BESTRON）
Feature
- Multiple mechanical loading conditions
Tension/Compression/Indentation/Bending/Impact/Fatigue
Auto, manual, cyclic loading
pm-level driving control；Newton level actuator(> 100 mN) - Outstanding electrical application and measurement
Versatile biasing procedures ； pA-level measurement - Double-tilt ： α tilting up to ±20° β tilting up to ±10°
- Stable atomic scale imaging
Limit sample drift < 50 pm /s； Spatial resolution ≤ 0.1nm
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