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ITEMLIST
Products Infomation
- Optical / Imaging / Precision Devices
- In-situ sample holder for transmission electron microscopy
- 【BESTRON】In-situ sample holder for TEM( thermal/ mechanical/electrical fields ) INSTEMS-MET
Is able to apply straining, heating and biasing inside TEM Changes of samples under heat/force/electricity can be observed in TEM
In-situ sample holder for TEM( thermal/ mechanical/electrical fields )
Model:
INSTEMS-MET
Maker:
Bestron (Beijing) Science and Technology Co.,Ltd.（BESTRON）
Feature
- Ultra wide temperature range ( RT-1200 ºC )
Ultra high heating precision ( < 0.1 ºC )；pm-level driving control Newton level actuator(> 100 mN) ； Multiple load conditions
Versatile biasing procedures；pA-level measurement - Alpha axial tilting up to ±25°； Beta axis tilting up to ±25°
- Ultimate sample drift<50 pm/s ；Spatial resolution ≤0.1 nm
- Mini-lab compatibility：MT/TE/ME/M/E/T
Current measurement range：1 pA-1 A；Max voltage：± 50 V
Spatial resolution：≤0.1 nm； EDS compatibility
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