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Products Infomation
- 【Shenzhen Kingcable Automation Testing(KINGCABLE)】SIC Power Semiconductor Device Dynamic Reliability Test KC3101
Aging test of SIC power semiconductor devices and other products
SIC Power Semiconductor Device Dynamic Reliability Test
Model:
KC3101
Maker:
Shenzhen Kingcable Automation Testing Co.,Ltd. (KINGCABLE)
Feature
- High-voltage high-frequency pulse: dv/dt>50v/ns, frequency 50KHz
- High precision: Current resolution 10pA, Voltage resolution 100nV
- Multi-parameter test：Vsd voltage, Vgsth voltage, Rds resistance
Lgss leakage current, Ldss leakage current, Temperature - 80 channels, each channel is independently controlled
Fault disconnection is timely, and no mutual influence - The test fixture is of electric heating type
- Modular construction, self checking function, high reliability
- Can be expanded with external standard instruments, customized
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