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SHASHIN KAGAKU Wafer Mapping Unit
Automatic, reliable film thickness mapping for up to 300 mm wafers -
SHASHIN KAGAKU Sheet thickness monitor
Infrared Sheet Thickness Monitors: Versatile for measuring battery separators, coatings, and silicon, suitable for lab and in-line production inspections. -
SHASHIN KAGAKU Compact Flim Thickness Monitor
Reflection spectrophotometric meter for laboratory to in-line inspection, measuring up to 9 transparent films simultaneously.
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