OxTS RT3000v4

OxTS RT3000v4
High performance GNSS/INS for ADAS and Autonomous vehicle testing

USHIO UV Irradiance Meter UIT-201
The Unimeter series was developed based on our experience and expertise as a manufacturer of optical equipment

NIKON ECLIPSE LV100N POL and Ci-POL
Nikon offers systems for both quantitative and qualitative study

NIKON Industrial Microscopes ECLIPSE MA100N
It is ideal for metallurgical material inspection in many industrial applications.

NIKON INVERTED MICROSCOPES ECLIPSE MA200
It is ideal for metallurgical material inspection in many industrial applications

NIKON Industrial Microscopes ECLIPSE LV100NDA and LV100ND
Nikon is designed for episcopic and diascopic optical contrast techniques.

NIKON INDUSTRIAL ECLIPSE LV150NA and LV150N
Modular, Motorised and Manual Upright Microscopes

NIKON ECLIPSE L300ND, L300N and L200ND, L200N
Nikon's ECLIPSE is a range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications.

Nobby Tech Two-color thermal image measurement system Thermera
Thermera is a temperature measurement system that employs a two-color algorithm.

NIKON Measuring Microscopes MM-200 Series
High Precision Construction for Accurate Measurement Results

DITECT Sperm Analyzer
Sperm motility and morphology analysis system

Photonic Lattice 2D Birefringence Measurement System WPA-200Series
Suitable for measurement of films and transparent resin products

Photonic Lattice 2D Birefringence Measurement System PA-300Series
Suitable for measurement of glassware and other low phase difference targets

Photron FASTCAM NOVA S20
The FASTCAM NOVA S20 offers the user the freedom to select between 10-bit and 12-bit operation to enhance performance, with megapixel recording rates up to 20,000fps and 16,500fps respectively.

JEOL JCM-7000 NeoScope™ Benchtop SEM
The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis"

JEOL JSM-IT200 InTouchScope™ Scanning Electron Microscope
JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope™, with significantly higher throughput.

JEOL JIB-PS500i FIB-SEM system
New Solutions for Specimen Preparation

DITECT High Speed Cameras HAS-U1
Perfect for all kinds of research / production engineering in behavior, fluid, sports science, biomechanical, robotics, machine vision, crash test, droplet, microscopy, trouble shooting, and more.

DITECT High Speed Cameras HAS-U2
Perfect for multiple high speed camera imaging with embedded memory in one compact solution.

DITECT High Speed Cameras HAS-EF
Perfect for multiple high speed camera imaging with 6GB embedded memory in one compact solution.

DITECT High Speed Cameras HAS-EX
1000 FPS at 1280×1024 pix.

Optical・Imaging・Precision Devices