NIKON ECLIPSE L300ND, L300N and L200ND, L200N | PT. NIHON DENKEI INDONESIA Jakarta

Nikon's ECLIPSE is a range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications.

Nikon's ECLIPSE L300ND, L300N and L200ND, L200NA is a range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications.

Industrial Microscopes

Model:

ECLIPSE L300ND, L300N and L200ND, L200N

Maker:

Nikon Metrology NV

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Nikon ECLIPSE L300N(D) and L200N(D)

These microscopes are for exceptionally precise optical inspection of wafers (200mm for L200N series and 300mm for L300N series), reticules and other substrates.

Nikon CFI60-2 Optical Series

Nikon’s innovative design enables clear imaging techniques, including high contrast, brightfield, darkfield, polarisation (POL), differential interference contrast (DIC) and double beam interferometry optical contrast.

Nikon Digital Sight Cameras

The full range of Nikon’s Digital Sight cameras efficiently captures images of a sample and deliver them to the image processing software of the NIS-Elements suite, together with microscope data on the objective lens used, magnification setting and light intensity.

Integration of L200N and Wafer Loader NWL200

Nikon wafer loaders are well accepted and trusted in the semiconductor industry and many installations are in use today.

Product Highlights

Nikon CFI60-2 Optical Series

Nikon’s innovative design enables clear imaging techniques, including high-contrast, brightfield, darkfield, polarization (POL), differential interference contrast (DIC) and double beam interferometry optical contrast.

Universal Optical Contrast Methods

Reflected light: brightfield, darkfield, polarising (POL), differential interference contrast (DIC), epi-fluorescence and two-beam interferometry.
Transmitted light: brightfield, darkfield, polarising, differential interference contrast and phase contrast.

Intelligent Digital Communication

The microscope detects and controls the objective lens in use, light intensity, episcopic illumination and aperture via a USB connection to Nikon’s NIS-Elements software.

Ergonomic Design Concept

Optimal positioning of operator controls with variable angle eye-tube allows fatigue-free work.
A right-way-up, right-way-around image is provided for correctly observing raw materials, semiconductors and industrial components.

Core Features

Optical Target for Easy and Precise Focusing

An optical target in the illumination path allows rapid, accurate focusing on low-contrast samples, e.g. bare wafers. This saves considerable time and gives the user confidence that they are exactly in the right focus position.

CFI60-2 Phase Fresnel Long Working Distance as Standard

Long Work Distance: by using exceptionally short distances between the phase Fresnel lens elements and the conventional lens elements, a far longer working distance is achieved compared with a traditional design.

Avoiding Material Contamination

The L-series is designed to minimise operator contamination of the material observed. A key feature is the antistatic coating applied to body, stage, eye-tube and other accessories.

Ergonomic X-Y Fine Stage Movement Control

The stage drop-controls for fine X-Y movement remain fixed in relation to the microscope’s fine focus control knob. It means that the operator can focus the image and adjust the stage position without moving their hand.

CFI60-2 Phase Fresnel Lens Elements

Colour aberration correction: two types of lens element, phase Fresnel and conventional design, combine to cancel out the chromatic aberration of each, resulting in greatly reduced colour distortion and excellent image quality.

Controls at the Front of the Microscope

The function control buttons are at the front of the microscope for easy access, making operation quick and easy. With controls located at the microscope base, hand movement is minimised, allowing concentration on the inspection task.

Industries

Applications are centred around inspection duties in the electronics and telecommunications sectors.

Antennae waveguides are measured with utmost precision, as well as other components such as wafers for semiconductor or photovoltaic devices and micro electro mechanical systems (MEMS) used in smartphones, gyroscopes and accelerometers, for example.

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