AIKOH Peeling data software

AIKOH Peeling data software
AIKOH Peeling data software for RZE(RZ) Series RZ-3000P

KIKUSUI PLZ-5W Series
KIKUSUI - Multifunctional Electronic Load PLZ-5W Series -

KIKUSUI -PXZ Series-
KIKUSUI -PXZ Series – 20kW Type-

SUGAWARA ADA-105
SUGAWARA -Anderon Analyzer ADA-105-

SUGAWARA – Anderon Meter –
SUGAWARA - Bearing Vibration Tester - Anderon Meter -

ONO SOKKI – VC-3200 –
ONO SOKKI - VC-3200 Vibration Comparator -

ONO SOKKI – LV-1800 –
ONO SOKKI - Laser Doppler Vibrometer LV-1800 -

ONO SOKKI -CF- 9200A / 9400A –
ONO SOKKI - CF-9200A / 9400A - Portable 2-Ch / 4-Ch FFT Analyzer

ONO SOKKI Torque Detector RH series
ONO SOKKI Torque Detector RH series

ONO SOKKI – Sound and Vibration Analysis system O-Solution DS-5000 –
ONO SOKKI - Sound and Vibration Analysis system O-Solution DS-5000

HIOKI – BATTERY TESTER BT6065, BT6075 –
HIOKI - PRECISION BATTERY TESTER BT6065, BT6075 -

IWASAKI -EYE 4D MULTI Chamber-
IWASAKI - EYE 4D MULTI Chamber

IWASAKI – EYE SUPER UV TESTER – SUV-W171 –
IWASAKI - EYE SUPER UV TESTER - SUV-W171 -

KEISOKU GIKEN Digital Ripple & Noise Meter
Digital Ripple & Noise Meter

NF Multifunction Generator WF1983/WF1984
Maximum 60MHz, easily outputting the necessary waveforms, improving test efficiency

GW INSTEK Multi-function Programmable Oscilloscope MPO-2000 series
Python Script Executable Oscilloscope

aptpod VISUAL M2M
A multifunctional user interface on the browser displays real-time data, stored data graphs, timeseries data visualization, and CSV download.

aptpod intdash
Platform middleware that enables rapid and advanced digital transformation

SHASHIN KAGAKU Wafer mapping film thickness measurement unit
Wafer Mapping Unit: Automatic, reliable film thickness mapping for up to 300 mm wafers, ideal for semiconductor manufacturing with self-calibration and cleanliness.

SHASHIN KAGAKU Sheet thickness monitor of the Infrared transmission absorption type
Infrared Sheet Thickness Monitors: Versatile for measuring battery separators, coatings, and silicon, suitable for lab and in-line production inspections.

SHASHIN KAGAKU Compact Flim Thickness Monitor
Reflection spectrophotometric meter for laboratory to in-line inspection, measuring up to 9 transparent films simultaneously.

Electronic Measuring Instruments