ADCMT Scanner/Extender 3100/3101

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The versatile 3100 scanner supports up to 17 slots, integrating seamlessly with digital voltmeters and data loggers. It features local and remote control via GPIB/USB interfaces for flexible operation, ideal for automated testing of semiconductors and electronic circuits. Its digital I/O function facilitates easy data transfer, while the expandable system supports sophisticated configurations, including sequential, direct, and random channel access, up to a maximum of 1,360 channels.

Scanner/Extender

Model:

3100/3101

Maker:

ADCMT

Features

System expansion according to configuration
Two switch cards can be mounted on the mainframe and three cards on each extender. Up to five externders can be connected by the scan buses. The distance between each device is up to 10 meter, and the total length is 20 m at a maximum. The extenders can be mounted according to the necessary number of measurement channels, allowing you to build cost-effective system configurations.

Graphical display for easy viewing of switching status
The 3100 adopts a large LCD screenm and displays the OPEN/CLOSE status of each modular card. The OPEN/CLOSE setting is available by local operation using the front panel.

Local operation and GPIB/USB control function
The local function to set the switching conditions on the front panel is suitable for small-scale systems comblined with digital voltmeters, digital recorders or other devices.
On the other hand, those switching conditions also can be set from the GPIB or USB interface, allowing you to build up automatic measuring systems flexibly.
In addition, not only sequential operation using control parameters, but also direct channel access for arbitrary channels and direct program access for arbitrary program steps are available. This direct access function is operationable by local or remote control, and random scan operation of 100 steps or more can be easily performed by using the GPIB or USB interface.

Advanced application by digital I/O function
The 3100 is equipped with the digital I/O or DIO functin. It adopts an open collector output and can output sink current up to 150 mA, so that it can be used to control lamps and large-sized relays.
It suppors the input level from the TTL level up to 28 V. The digial I/O function is aslo convinient for data transfer with devices that have no GPIB interface.

Flexible support with various switching functions
The 3100 is provided with seven switch cards of three types, and functions as multiple scanners by itself in combination with these switch cards.
Thus, it offers flexible solutions as data logger for multiple points and switching device of an automatic test system such as for semiconductors, electronic components and electronic circuits.

Maximum 160 channels in 2 slots
The 3100 has 2 slots, in which maximum 160 channels in total are available when using two 31001F by 1 wire.
By connecting five 3101 extenders, the configuration can be expanded up to 17 slots, that is, maximum 1,360 channels (1-wire 31001F).

Applications

Solar cell exposure test I-V characteristic measurement system
This figure is a configuration example of an I-V characteristic measurement system for exposure test on forty solar panels.
Four 3101 extenders are connected to the 3100 scanner.
The forty solar panels are connected in 4-wire connection by using four large-current cards of the 31001K to eliminate errors in the cables, and then the I-V characteristics are measured in turn.
Prepare two sets of the 31005B and the 31009M in combination and connect them as multiplexor to the temperature sensors next to the solar panels. By using the measured temperature, the I-V measured values can be corrected.

Automatic test system for electronic circuits or components
This is a configuration example of integrated test systems for analog ICs. The crosspoints of the matirix cards can be opened or closed as desired. Also, any input or output of the X direction can be onnected to any input or output of the Y direction. Therefore, by connecting measuring and sourcing devices to the Y directon and the pins of an IC to the X direction, the inputs and outputs of those devices can be connected to any pin of the IC. You can use cards in combination according to the number of devices and the number of IC pins.

Multi-point data collection and process system
This is an configuration example of automatic temperature coefficient measurement systems having forty resitors. The 4-wire measurement method is used for low-resistnance measurement. The temperautre of the constant temperature chamber is controlled by the DV voltage source and is monitored by the digital multimeter having temperature measurenent function. Thus, the resistance values is measured at each temperature and is stored by the controller. Then, the temperature coefficient of each resistor is calculated from the difference in measurement temperature and reistance value variation, and is printed by the printer.

Status monitor system using digital I/O function
The digital I/O function of the 3100 has 16-bit interactive input and output lines, and the input and output can be set by 8 bits. Thus, eight lines can be used for controlling and other eight lines are for status monitoring. Otherwise, all the sixteen bits can be set as input or output.

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