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ITEMLIST
Products Infomation
- Kategori Produk
- Optical・Imaging・Precision Devices
- Focused ion beam (FIB)
- JEOL JSM-IT200 InTouchScope™ Scanning Electron Microscope
JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope™, with significantly higher throughput.
SM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope™, with significantly higher throughput.
Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, SMILE VIEW™ Lab for seamless report generation of observation and/or analysis results, etc., provide fast analysis with integrated transition from OM to SEM.
Fast observation, analysis and report generation!
JEOL InTouchScope™ series, the high performance analytical tool with major three functions.
Scanning Electron Microscope
Model:
SEM: JSM-IT200
Maker:
JEOL Ltd.
SPECIMEN EXCHANGE NAVI: GUIDED OPERATION FROM SAMPLE INTRODUCTION TO OBSERVATION
A step-by-step guide to sample exchange, condition setting and automatic imaging.
FAST OBSERVATION! “ZEROMAG”
You can locate the specimen area or specify analysis positions with Holder Graphics or Optical CCD image*1 displayed on the Main screen.
Zeromag image displayed on the Main screen
FAST ANALYSIS! “LIVE ANALYSIS”*2
The characteristic X-ray spectrum from the measurement area and the main constituent elements are displayed during observation.
SEM observation screen
FAST REPORT GENERATION! SMILE VIEW™ LAB: INTEGRATED DATA MANAGEMENT
Single-click of the data management button displays the Data management screen, allowing you to generate a report of all images and analysis data, as well as review or re-analyze already-acquired data.
*1 To take a CCD image, optional SNS (stage navigation system) is required.
*2 Applicable to LA (Low Vacuum & Analysis) versions.
JEOL InTouchScope™ series, the high performance analytical tool with major three functions.
SPECIMEN EXCHANGE NAVI: GUIDED OPERATION FROM SAMPLE INTRODUCTION TO OBSERVATION
A step-by-step guide to sample exchange, condition setting and automatic imaging.
FAST OBSERVATION! “ZEROMAG”
You can locate the specimen area or specify analysis positions with Holder Graphics or Optical CCD image*1 displayed on the Main screen.
Zeromag image displayed on the Main screen
FAST ANALYSIS! “LIVE ANALYSIS”*2
The characteristic X-ray spectrum from the measurement area and the main constituent elements are displayed during observation.
SEM observation screen
FAST REPORT GENERATION! SMILE VIEW™ LAB: INTEGRATED DATA MANAGEMENT
Single-click of the data management button displays the Data management screen, allowing you to generate a report of all images and analysis data, as well as review or re-analyze already-acquired data.
*1 To take a CCD image, optional SNS (stage navigation system) is required.
*2 Applicable to LA (Low Vacuum & Analysis) versions.
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