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JEOL JCM-7000 NeoScope™ Benchtop SEM
The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis" -
JEOL JSM-IT200 InTouchScope™ Scanning Electron Microscope
JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope™, with significantly higher throughput. -
JEOL JIB-PS500i FIB-SEM system
New Solutions for Specimen Preparation
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