DITECT High Speed Cameras HAS-D73

DITECT High Speed Cameras HAS-D73
2,000FPS at 1.3 megapixel (1280x1028) with a new image sensor will cover multiple applications.

DITECT High Speed Cameras HAS-D71
8,000fps in VGA resolution with a new Japanese high sensitive image sensor will help you especially in low light condition.

DITECT High Speed Cameras HAS-DX
Full HD at 2,000fps Maximum shooting speed at 100,000fps

Ditect View Tracker Lightweight wearable eye tracking system
ViewTracker3 is a new eye tracking measurement system with a light-weight headset that adopted USB3.0 for its interface.

Nikon NEXIV VMZ-H3030
Offering advanced usability and performance, the NEXIX VMZ-H3030 achieves the highest accuracy within Nikon's NEXIV series.

Nikon NEXIV VMZ-K Series
The NEXIV-K Series is capable of high-speed, high-resolution, 3D inspection.

Nikon iNEXIV VMA Series
With a large field of view, a long working distance and large XYZ strokes, the iNEXIV VMA series offers the ultimate in usability for automatic measurement of 3D components.

Nikon NEXIV VMZ-S Series
Nikon's NEXIV VMZ-S series of video measuring systems delivers high accuracy, speed and usability for inspection applications down to the micro level.

Pulstec ‘muraR’ Non-Contact Surface Hardness Variation Scanner
World's first technology! Automatic scanner of 'Hardness Variation' of surface of steel by non-contact and non-destructive inspection.

Pulstec μ-X360s Portable X-ray Residual Stress Analyzer
Portable X-ray Residual Stress Analyzer Non-Contact Surface Hardness Variation Scanner

Fluke ii900 Industrial Acoustic Imager
A Revolution in Compressed Air, Gas and Vacuum Leak Detection

Hitachi XRF Analyzer EA1000AIII
The EA1000A III X-ray Fluorescence Analyzer achieves better throughout by shortening the measurement time by 1/3 compared with our previous model.

Hitachi XRF Analyzer EA1400
EA1400 delivers on reducing measurement time, simplifying the management of measurement results, reducing operational mistakes, and improving efficiency.

Hitachi X-ray Particle Contaminant Analyzer EA8000A
EA8000A enables rapid detection and elemental identification of metal particles approximately 20 µm in diameter found in the electrode plates of fuel cells and lithium ion rechargeable batteries.

Hitachi Fluorescent X-ray (XRF) Coating Thickness Gauge FT110A
The FT110A XRF Coating Thickness Gauge has a new auto focus function which automatically focuses on the sample to acquire optical image within a few seconds.

Hitachi FT230 | Automated XRF for rapid coatings analysis
The FT230 benchtop XRF analyzer has been designed to significantly reduce the time taken to make a measurement.

Hitachi X-ray (XRF) Coating Thickness Gauge FT160 Series
Equipped with polycapillary X-ray focusing optics and a silicon drift detector, FT160 enables high preciseness and high throughput in nano-order level coating thickness measurement of electronic parts.

Hitachi High-Tech Launches the AFM100 Pro High-Sensitivity Scanning Probe Microscope System with Improved Detection Sensitivity
Pursuing improved sensitivity when measuring physical properties and measurement at atomic and molecular scales

Saitoh Kougaku SKM-Z300C-PCM2
CMOS camera with 2 million pixels and x4 optical lens are mounted! Microscope for computer USB 2.0

Saitoh Kougaku SKM-Z300C-PCD
x4 optical zoom lens is mounted! Magnification on a screen is x27.5 to x110

Saitoh Kougaku SKM-Z200C-PCD
x6 optical zoom lens is mounted! Magnification on a screen is x55 to x330

Optical・Imaging・Precision Devices