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Products Infomation
- Kategori Produk
- Optical・Imaging・Precision Devices
- Focused ion beam (FIB)
- JEOL JCM-7000 NeoScope™ Benchtop SEM
The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis"
The JCM-7000 incorporates three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis" for finding constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation.
When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.
JCM-7000 NeoScope™ Benchtop SEM
Maker:
JEOL Ltd.
Video Product
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