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USHIO UV Irradiance Meter UIT-201
The Unimeter series was developed based on our experience and expertise as a manufacturer of optical equipment -
NIKON ECLIPSE LV100N POL and Ci-POL
Nikon offers systems for both quantitative and qualitative study -
NIKON Industrial Microscopes ECLIPSE MA100N
It is ideal for metallurgical material inspection in many industrial applications. -
NIKON INVERTED MICROSCOPES ECLIPSE MA200
It is ideal for metallurgical material inspection in many industrial applications -
NIKON Industrial Microscopes ECLIPSE LV100NDA and LV100ND
Nikon is designed for episcopic and diascopic optical contrast techniques. -
NIKON INDUSTRIAL ECLIPSE LV150NA and LV150N
Modular, Motorised and Manual Upright Microscopes -
NIKON ECLIPSE L300ND, L300N and L200ND, L200N
Nikon's ECLIPSE is a range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. -
Nobby Tech Two-color thermal image measurement system Thermera
Thermera is a temperature measurement system that employs a two-color algorithm. -
NIKON Measuring Microscopes MM-200 Series
High Precision Construction for Accurate Measurement Results -
DITECT Sperm Analyzer
Sperm motility and morphology analysis system -
Photonic Lattice 2D Birefringence Measurement System WPA-200Series
Suitable for measurement of films and transparent resin products -
Photonic Lattice 2D Birefringence Measurement System PA-300Series
Suitable for measurement of glassware and other low phase difference targets -
Photron FASTCAM NOVA S20
The FASTCAM NOVA S20 offers the user the freedom to select between 10-bit and 12-bit operation to enhance performance, with megapixel recording rates up to 20,000fps and 16,500fps respectively. -
JEOL JCM-7000 NeoScope™ Benchtop SEM
The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis" -
JEOL JSM-IT200 InTouchScope™ Scanning Electron Microscope
JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope™, with significantly higher throughput. -
JEOL JIB-PS500i FIB-SEM system
New Solutions for Specimen Preparation -
DITECT High Speed Cameras HAS-U1
Perfect for all kinds of research / production engineering in behavior, fluid, sports science, biomechanical, robotics, machine vision, crash test, droplet, microscopy, trouble shooting, and more. -
DITECT High Speed Cameras HAS-U2
Perfect for multiple high speed camera imaging with embedded memory in one compact solution. -
DITECT High Speed Cameras HAS-EF
Perfect for multiple high speed camera imaging with 6GB embedded memory in one compact solution. -
DITECT High Speed Cameras HAS-EX
1000 FPS at 1280×1024 pix. -
DITECT High Speed Cameras HAS-D73
2,000FPS at 1.3 megapixel (1280x1028) with a new image sensor will cover multiple applications. -
DITECT High Speed Cameras HAS-D71
8,000fps in VGA resolution with a new Japanese high sensitive image sensor will help you especially in low light condition. -
DITECT High Speed Cameras HAS-DX
Full HD at 2,000fps Maximum shooting speed at 100,000fps -
Ditect View Tracker Lightweight wearable eye tracking system
ViewTracker3 is a new eye tracking measurement system with a light-weight headset that adopted USB3.0 for its interface. -
Nikon NEXIV VMZ-H3030
Offering advanced usability and performance, the NEXIX VMZ-H3030 achieves the highest accuracy within Nikon's NEXIV series. -
Nikon NEXIV VMZ-K Series
The NEXIV-K Series is capable of high-speed, high-resolution, 3D inspection. -
Nikon iNEXIV VMA Series
With a large field of view, a long working distance and large XYZ strokes, the iNEXIV VMA series offers the ultimate in usability for automatic measurement of 3D components. -
Nikon NEXIV VMZ-S Series
Nikon's NEXIV VMZ-S series of video measuring systems delivers high accuracy, speed and usability for inspection applications down to the micro level. -
Pulstec ‘muraR’ Non-Contact Surface Hardness Variation Scanner
World's first technology! Automatic scanner of 'Hardness Variation' of surface of steel by non-contact and non-destructive inspection. -
Pulstec μ-X360s Portable X-ray Residual Stress Analyzer
Portable X-ray Residual Stress Analyzer Non-Contact Surface Hardness Variation Scanner -
Fluke ii900 Industrial Acoustic Imager
A Revolution in Compressed Air, Gas and Vacuum Leak Detection -
Hitachi XRF Analyzer EA1000AIII
The EA1000A III X-ray Fluorescence Analyzer achieves better throughout by shortening the measurement time by 1/3 compared with our previous model. -
Hitachi XRF Analyzer EA1400
EA1400 delivers on reducing measurement time, simplifying the management of measurement results, reducing operational mistakes, and improving efficiency. -
Hitachi X-ray Particle Contaminant Analyzer EA8000A
EA8000A enables rapid detection and elemental identification of metal particles approximately 20 µm in diameter found in the electrode plates of fuel cells and lithium ion rechargeable batteries. -
Hitachi Fluorescent X-ray (XRF) Coating Thickness Gauge FT110A
The FT110A XRF Coating Thickness Gauge has a new auto focus function which automatically focuses on the sample to acquire optical image within a few seconds. -
Hitachi FT230 | Automated XRF for rapid coatings analysis
The FT230 benchtop XRF analyzer has been designed to significantly reduce the time taken to make a measurement. -
Hitachi X-ray (XRF) Coating Thickness Gauge FT160 Series
Equipped with polycapillary X-ray focusing optics and a silicon drift detector, FT160 enables high preciseness and high throughput in nano-order level coating thickness measurement of electronic parts. -
Hitachi High-Tech Launches the AFM100 Pro High-Sensitivity Scanning Probe Microscope System with Improved Detection Sensitivity
Pursuing improved sensitivity when measuring physical properties and measurement at atomic and molecular scales -
Saitoh Kougaku SKM-Z300C-PCM2
CMOS camera with 2 million pixels and x4 optical lens are mounted! Microscope for computer USB 2.0 -
Saitoh Kougaku SKM-Z300C-PCD
x4 optical zoom lens is mounted! Magnification on a screen is x27.5 to x110 -
Saitoh Kougaku SKM-Z200C-PCD
x6 optical zoom lens is mounted! Magnification on a screen is x55 to x330 -
Saitoh Kougaku SKM-S31C-PC
Microscope for computer USB2.0 High magnification type continuous variable magnification system -
Saitoh Kougaku SKM-S30D-PC
Microscope for computer USB2.0 continuous variable magnification system
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