NF Frequency Response Analyzer FRA51615

Measurable frequency range

10 µHz to 15 MHz
Supports low frequencies of 10 µHz all the way to 15 MHz.
Resolution has also been increased to 10 µHz. Ultra-low frequencies required for electromechanical impedance testing is also supported.

Testing speed

0.5 ms/point
Maximum sweep speed of 0.5 ms/point is definitely fast.
This device can help reduce production line tact times.

Fundamental accuracy

Gain ±0.01 dB, Phase ±0.06°
Highly accurate measurements are achieved with digital Fourier conversion and self-calibration functionality.

*Accuracy varies depending on testing conditions.

Dynamic range

140 dB
A larger dynamic range has been achieved with a high-resolution A/D converter and auto ranging functionality that optimizes testing ranges per frequency measurement point. Highly accurate measurements can be taken even when changes occur during testing.

Isolation

600 V CAT II / 300 V CAT III
The oscillator output (OSC) and 2 analysis inputs (CH1 and CH2) are isolated from the chassis. Terminals are also isolated from each other. Available isolation ratings include 600 V CAT II and 300 V CAT III.

For the loop and gain testing of power circuits such as high-voltage inverters and PFC circuits, this further expands the range of applications supported by FRAs.

Auto range

This feature automatically tracks the input signal level so that the range is constantly optimized during testing. Once noise that exceeds the range is detected, the system automatically sets a larger range. Measurement data will not become saturated within specific ranges. It is also possible to select a fixed range in order to avoid discontinuities in the measurement values associated with range changes.

Automatic, high-density sweeps

The FRA51615 supports high-density testing of up to 20,000 points as well as automatic adjustment of frequency density specifically during intervals of sudden changes in measurement data.

Amplitude compression

To prevent saturation and damage of test devices, oscillator levels are controlled to match the amplitude level of the test device.

Integrator

The data integrator is used to remove the effects of noise while measuring. The period of repeated testing is configured in cycles or time.

Automatic integrator

Integrals are repeated until variation in measurements due to noise lower than a preconfigured value.

Delay function

This function delays the start of testing to reduce error caused by transient responses during frequency changes. A function has also been added to delay the start of testing only for start of sweep testing or spot testing.

Differential and integral operations

This feature calculates differentials, second-order differentials, integrals, and double integrals for the time domain of measurement data. For example, this is useful for calculating displacement, speed, and acceleration from acceleration sensor or laser doppler vibrometers.

Interfaces

GPIB, USB, LAN, RS-232, VGA

With these interfaces, automated testing systems can be built. A VGA port is also included on the rear to connect with external monitors. Refer to the description of the right figure of the rear side of the device for more information on other output ports.