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ITEMLIST
Products Infomation
- Kategori Produk
- Electronic measuring instruments
- Circuit ・ Element ・ Parts evaluation measuring instruments
- Electrical safety testers / measuring instruments
- MICROTEST USB Type-C Cable Tester 8761NAC
Dedicated USB Type-C Cable Comprehensive Testing Solution (E-Marker IC/Voltage Drop/Protection Components/Electrical Testing)
For USB Type-C cable/connector testing, the dedicated option MICROTEST 8761NAC is available. It utilizes a four-wire measurement technology and supports automatic detection of USB Type-C loop orientation for connectors. It offers a maximum AC withstand voltage of 700V and a maximum DC withstand voltage of 1000V. It is equipped with the FX-000C28 2-in-1 current source expansion box, which provides the capability to perform continuity impedance, open/short circuit, safety withstand voltage insulation, RA resistance, and filtering capacitor tests on USB Type-C cables/connectors.
By selecting the FX-000C28 2-in-1 current source expansion box, it is possible to conduct 5A voltage drop internal resistance testing and VDO code reading for E-Marker IC on USB Type-C cables.
USB Type-C Cable Tester
Model:
8761NAC
Maker:
MICROTEST
4-Wire Test
Connect to DUT directly to prevent any deviation.
For measuring low resistance DUT, we recommend to choose 4-wire tester.
The measurement items of 8761/8761NAK cable or harness tester have (1) Open/Short;(2) Conductance; (3) Components; (4) AC Hipot; (5) DC insulation/ Hipot; (6) Quick conductance (7) Intermittence O/S, and (8) Quick Intermittence open circuit. It supports RS-232, USB Host, Print, Remote interfaces.
| Conductance | Detect the contact resistance in the cable connector. The conduction resistance is over the standard. |
| Open/Short Test | Make sure the contact of wire work properly.
Open: The wire should be contact, but it doesn’t Short: The wire shouldn’t be contacted, but it does |
| Intermittence O/S | Make sure the cable has intermittent open/short
defection |
Put a stabile high voltage on cable to make sure the quality of DUT
- _DC insulation
The result will judge by the rate of insulation resistance. Insulation resistance defect may cause DUT be penetrated or leakage current under high voltage.
- _Arc Test
Some high precision product for automobile and military can’t accept any arc under high voltage.
Inspect the loop contact in the connector fit the request of insulation and voltage.
Insulation resistance between loop is lower than the standard.
The voltage resistance is lower than the standard that cause leakage current.
Support for Component Measurement Functionality
_Resistance Test
_Capacitance Test
_Diode Test
Features
- 4-wire measurement conductance 1mΩ-52Ω
- Test pin 64/128
- E-Marker IC Test
- Voltage Drop Test (5A)
- Open/Short
- Conductance
- AC/DC Hipot Test
- DC insulation
- Support bar code scan and print function
- Automatically identify the normal or reverse plugin of wire or connectors
Application
Universal Serial Bus a.k.a. USB
is the interface connect computer and outer device
USB Type-C can be insert by both side, and better power supply. Replace the VGA/DVI/HDMI video transmitting.
USB Type-C give the consumer better experience for transmitting data, media sharing charging mobile device by using on USB cable. Compatible with DisplayPort, MHL and Thunderbolt 3, etc. USB-C will replace more transmitting interface in the future.
Due to the various charging mode that may caused the unfit specification damage the cable and user, USB Type-C needs to insert an E-Mark IC to control the operation. The inspection for protection chip around E-Mark IC is important.
E-Mark IC is the critical part of Type-C interface. Manufacturer takes the quality of protection component around E-Mark IC really seriously.
- _Isolation Diode
- _RA Resistance
- _Signal line to ground line filter capacitor
- _Signal line to ground line filter capacitor
8761NAC is a multifunctional portable tester. Not only detect the poor processing product, but also the O/S status between each contact and the protection component around E-Mark IC.
A desktop portable instrument included conduction, Hi-Pot, component, multi-functional tester fulfill USB Type-C harness inspection.
2-in-1 Current Expand Box FX-000C28 (5A) can measure voltage difference and inner resistance.
And test the USB Type-C E-Marker IC’s code.
Qualcomm has combine QC 4.0 and latest PD spec.. High Current low voltage is the trend in the future.
Voltage difference and Resistance is the important figures for the quality.
- _Voltage difference, smaller is better
The resistance might cause voltage difference problem because of the high current transmitting. Charger might be damaged if the voltage difference is too high.
- _Inner Resistance, smaller is better
The material of cable will affect the efficiency of charging. The inner resistance will increase under high current. With our expansion box, you might able to detect voltage difference and inner resistance.
8761NAC USB Type-C Tester
Specifications
| Model | 8761NAC |
| AC Hi pot Test | 100V-700V |
| DC Hi pot Test | 50V-1000V |
| Test Pin | 64/128 |
| Model | 8761NAC |
| Safety Hi pot Test | |
| AC Hipot Leakage Current | 0.01mA -5mA |
| AC Arcing Detection | 0-9 |
| DC Hipot Leakage Current | 0.1µA-1000µA |
| DC Arcing Detection | 0-9 |
| DC Hipot Insulation Resistance | 1MΩ-1.2GΩ |
| Hipot Output Accuracy | ±5% |
| Hipot Measurement Accuracy | ±5% |
| Rated Output | 5Vdc |
| Hipot Measurement Time | 0.01秒 – 60秒 |
| Wire Specifications | Maximum allowable capacitance 5μF |
| Low Voltage Electrical Test | |
| Measuring Mode | 4-Wire Test |
| Conductance | 1mΩ-52Ω |
| Intermittence Conductance | 1mΩ-52Ω |
| O/S
Intermittence O/S Quick Intermittence open circuit |
1kΩ-100kΩ |
| O/S Determinal Judge | ● |
| Single-Side Test | ● |
| OS Positive and Negative Judgment Method | Learning netlist by four groups |
| OS Voltage | Adjustment range 0.1V-4V |
| OS Netlist Test Mode | Pattern/point-by-point scanning |
| Component test | |
| Resistance | Measurement Range
50mΩ-20MΩ |
| Level Signal
0.5-3V |
|
| Current Signal
10mA |
|
| Capacitance | Measurement Range
10pF-12µF |
| Level Signal
0.3V-1.2V |
|
| Frequency Signal
AUTO Gear (Optional) 48Hz/480Hz/4.8kHz/48kHz |
|
| Diode | Measurement Range
0-6.8V |
| Other Function | |
| Advanced Functions | Programmable continuous test / Pin
search/Auto-diagnosis |
| Test Scan Mode | Auto, Manual, External Trigger |
| Measurement Signal | Low Voltage Measurement Signal |
| Panel | System/Rapid /Edit / Function |
| Indicator | Pass/Fail HV LED red-green indicator
lights / Screen Display /Sound |
| Operation | Manual, Auto, Remote Control |
| Built-in Storage | Number of test file up to 500 sets |
| Power Supply | Fixed Voltage
115/230 Vac ±10% |
| Frequency
60/50Hz |
|
| Power consumption | 300VA |
| Environment | Temperature
0℃-40℃ |
| Humidity
RH≦75% |
|
| Display | 320*240 dot-matrix display |
| Dimension
(W*H*D) & Weight |
64PIN
435x145x406 mm 8.44Kg |
| 128PIN
435x145x406 mm 9.3Kg |
|
| Interface | RS-232, USB Host, Print, Remote |
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