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Pursuing improved sensitivity when measuring physical properties and measurement at atomic and molecular scales
AFM is a type of measurement and analysis device that scans the surface of a sample using a probe with a tip that is just a few nanometers*3 in diameter. AFM can visualize a sample surface at the nanoscale, and simultaneously performing physical property evaluations. AFM is used in research and development and quality control across a wide range of industries, such as semiconductor, polymer, and biomedical. Hitachi High-Tech provides a wide range of user-friendly AFM devices and has been constantly improving the reliability of these devices by simplifying the AFM measurement process and preventing data variances caused by the operator.
Pro High-Sensitivity Scanning Probe Microscope System with Improved Detection Sensitivity
Model:
AFM100
Maker:
Hitachi High-Tech Corporation
AFM100 Pro Features
To face these challenges, the AFM100 Pro developed by Hitachi High-Tech is equipped with a newly developed high-sensitivity optical head that uses photothermal excitation to achieve improved sensitivity when measuring physical properties and measurement at the atomic and molecular scales.
The main features of this product are as follows:
- 1. High-sensitivity optical head improves sensitivity when measuring physical properties
The newly developed high-sensitivity optical head reduces the noise level for cantilever displacement detection and optimizes detection sensitivity.
In addition, the photothermal excitation function (IR-Drive), which excites the cantilever using light, enables a stable control of the cantilever oscillation amplitude in the sub-nm order. This enables high-resolution measurement when observing in liquids.
- 2. Advanced correlation analysis with high-sensitivity measurement of physical properties and SEM observation at the same location
The high-sensitivity optical head with a significantly reduced noise level enables the detection of subtle differences in physical property, which could not be observed using conventional optical heads due to relatively higher noises. The optional AFM Marking function makes it easy to observe the same location as the SEM*4, contributing significantly to identifying the factors behind the subtle differences in physical property information.
- 3. Scalable and durable
The standard AFM100 model and the AFM100 Plus can both be upgraded to the AFM100 Pro. For example, you can start with the budget friendly AFM100, then upgrade to the AFM100 Pro later if you need a higher level of analysis. In addition, a self-checking function is included as standard, to ensure the reliability of the equipment for a long time.
Hitachi High-Tech will continue to provide innovative solutions like this product in a timely manner, while working on Observation, Measurement and Analysis to solve social issues together with our customers, as well as contributing to cutting-edge manufacturing.
About AFM100 Pro
Item | AFM100 Pro |
---|---|
Detection system | Optical lever method high-frequency modulated LD (laser diode) |
Cantilever excitation method | Photothermal excitation/piezoelectric excitation |
Sample size | Up to ø35 mm, 10 mm thick (with optional extensions: up to 50 mm × 50 mm, 20 mm thick) |
Scanning range | All selectable options (XY/Z): 20/1.5, 100/15, 150/5 (unit: µm) |