{"id":5817,"date":"2023-04-01T10:01:16","date_gmt":"2023-04-01T02:01:16","guid":{"rendered":"https:\/\/www.n-denkei.com\/singapore\/?page_id=5817"},"modified":"2023-04-21T14:00:58","modified_gmt":"2023-04-21T06:00:58","slug":"semiconductor-temperature-characteristic-test","status":"publish","type":"page","link":"https:\/\/www.n-denkei.com\/singapore\/semiconductor-temperature-characteristic-test\/","title":{"rendered":"Semiconductor temperature characteristic test"},"content":{"rendered":"<link href=\"\/css\/philippines\/hioki_202109.css\" rel=\"stylesheet\" media=\"all\" type=\"text\/css\" \/>\n<div align=\"center\">\n<div class=\"section_container\" style=\"margin-top: 0px;width: 70%\">\n<p><!--kim\u8ffd\u52a0\u90e8\u5206--><\/p>\n<section id=\"mainimg\" style=\"margin-top: 0px\"><img decoding=\"async\" loading=\"lazy\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/\u30b9\u30af\u30ea\u30fc\u30f3\u30b7\u30e7\u30c3\u30c8-2023-03-28-13.56.36.png\" alt=\"\" width=\"100%\" height=\"auto\" \/><\/p>\n<div class=\"mainTit01Wrap\">\n<div class=\"mainTit01\">\n<div class=\"mainTit01In\">\n<p class=\"subTit type01\">Semiconductor temperature characteristic test<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<p><!--kim\u8ffd\u52a0\u90e8\u5206--><\/p>\n<section>\n<div class=\"bg-wh\">\n<h2>Summary Description<\/h2>\n<hr class=\"orange\" \/>\n<section>\n<div class=\"bg-wh text-align-left\">\n<p>Temperature characteristics testing for semiconductor is mandatory because semiconductor\u2019s characteristics vary with temperature.<\/p>\n<p>Conventional Si devices and other devices require tests at temperatures up to 120\u00b0C, while power devices such as SiC and GaN require tests at temperatures up to 150\u00b0C.<\/p>\n<p class=\"mt50\">In addition, in the automotive industry, a low-temperature test of-50\u00b0C is required. Thus, in the semiconductor industry, testing in a wide range of temperature environments is essential.<\/p>\n<\/div>\n<\/section>\n<p><img decoding=\"async\" class=\"mb50\" style=\"margin-top: 50px;margin-bottom: 20px\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/\u30b9\u30af\u30ea\u30fc\u30f3\u30b7\u30e7\u30c3\u30c8-2023-03-28-12.05.53.png\" \/><\/p>\n<p class=\"mt50 mb50\" style=\"margin: 0px 0px 80px 0px\">Illustration creation cooperation : ESPEC CORP., IWATSU ELECTRIC CO.,LTD.<\/p>\n<\/div>\n<\/section>\n<!--\u30b3\u30f3\u30c6\u30f3\u30c4\uff13\u3053\u3053\u304b\u3089-->\n<section class=\"post-content\">\n<h2>Product Details<\/h2>\n<hr class=\"orange\" \/>\n<div class=\"flex-container mt100\">\n<p><!--\n\n\n<div class=\"flex-items\">\n\n\n<div align=\"center\">\n\n\n<div class=\"item-img\"><img decoding=\"async\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/\u30b9\u30af\u30ea\u30fc\u30f3\u30b7\u30e7\u30c3\u30c8-2023-03-28-12.08.28.png\"><\/div>\n\n\n<\/div>\n\n\n\n\n<div class=\"item\">\n\nCompact environmental tester SU-662\n\n<a class=\"btn-find-out-more\" href=\"http:\/\/stg.n-denkei.com\/singapore\/items\/product\/advanced-handy-tachometer-ft-7200\/\">find out more<i class=\"fa fa-angle-right\"><\/i><\/a><\/div>\n\n\n<\/div>\n\n\n\n\n<div class=\"flex-items\">\n\n\n<div align=\"center\">\n\n\n<div class=\"item-img\"><img decoding=\"async\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/\u30b9\u30af\u30ea\u30fc\u30f3\u30b7\u30e7\u30c3\u30c8-2023-03-28-12.08.33.png\"><\/div>\n\n\n<\/div>\n\n\n\n\n<div class=\"item\">\n\nTest fixture CS-304\n\n<a class=\"btn-find-out-more\" href=\"http:\/\/stg.n-denkei.com\/singapore\/items\/product\/hioki-memory-hilogger-lr8450\/\">find out more<i class=\"fa fa-angle-right\"><\/i><\/a><\/div>\n\n\n<\/div>\n\n\n--><\/p>\n<div class=\"flex-items\">\n<div align=\"center\">\n<div class=\"item-img\"><img decoding=\"async\" src=\"https:\/\/www.n-denkei.com\/singapore\/wp-content\/uploads\/sites\/3\/2022\/06\/5400.jpeg\" \/><\/div>\n<\/div>\n<div class=\"item\">\n<p>Semiconductor curve tracer CS-5400<\/p>\n<p><a class=\"btn-find-out-more\" href=\"https:\/\/www.n-denkei.com\/singapore\/items\/product\/curve-tracer-cs-5400\/\">find out more<i class=\"fa fa-angle-right\"><\/i><\/a><\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>Semiconductor temperature characteristic test Summary Description Temperature characteristics testing for semiconductor is mandatory because semiconductor\u2019s characteristics vary with temperature. Conventional Si devices and other devices require tests at temperatures up to 120\u00b0C, while power devices such as SiC and GaN require tests at temperatures up to 150\u00b0C. In addition, in the automotive industry, a low-temperature\u2026<\/p>\n","protected":false},"author":58,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"freepage.php","meta":{"_mi_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0},"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.n-denkei.com\/singapore\/wp-json\/wp\/v2\/pages\/5817"}],"collection":[{"href":"https:\/\/www.n-denkei.com\/singapore\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.n-denkei.com\/singapore\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.n-denkei.com\/singapore\/wp-json\/wp\/v2\/users\/58"}],"replies":[{"embeddable":true,"href":"https:\/\/www.n-denkei.com\/singapore\/wp-json\/wp\/v2\/comments?post=5817"}],"version-history":[{"count":10,"href":"https:\/\/www.n-denkei.com\/singapore\/wp-json\/wp\/v2\/pages\/5817\/revisions"}],"predecessor-version":[{"id":6001,"href":"https:\/\/www.n-denkei.com\/singapore\/wp-json\/wp\/v2\/pages\/5817\/revisions\/6001"}],"wp:attachment":[{"href":"https:\/\/www.n-denkei.com\/singapore\/wp-json\/wp\/v2\/media?parent=5817"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}