{"id":2625,"date":"2023-03-31T18:13:36","date_gmt":"2023-03-31T09:13:36","guid":{"rendered":"https:\/\/www.n-denkei.com\/philippines\/?page_id=2625"},"modified":"2023-04-01T22:44:31","modified_gmt":"2023-04-01T13:44:31","slug":"reliability-test-of-semiconductors-and-electronic-components","status":"publish","type":"page","link":"https:\/\/www.n-denkei.com\/philippines\/reliability-test-of-semiconductors-and-electronic-components\/","title":{"rendered":"Reliability test of semiconductors and electronic components"},"content":{"rendered":"<link rel=\"stylesheet\" type=\"text\/css\" href=\"\/css\/philippines\/hioki_202109.css\" media=\"all\">\n<div align=\"center\">\n<div class=\"section_container\" style=\"\n    margin-top: 0px;width:70%;\"><br \/>\n<!--kim\u8ffd\u52a0\u90e8\u5206--><\/p>\n<section id=\"mainimg\" style=\"margin-top: 0px\">\u3000\u3000<br \/>\n<img decoding=\"async\" loading=\"lazy\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/\u30b9\u30af\u30ea\u30fc\u30f3\u30b7\u30e7\u30c3\u30c8-2023-03-28-13.56.36.png\" alt=\"\" width=\"100%\" height=\"auto\" \/><\/p>\n<div class=\"mainTit01Wrap\">\n<div class=\"mainTit01\">\n<div class=\"mainTit01In\">\n<p class=\"subTit type01\">Reliability test of semiconductors and electronic components<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<p><!--kim\u8ffd\u52a0\u90e8\u5206--><\/p>\n<section>\n<div class=\"bg-wh\">\n<!--\n\n\n<h2>Summary Description<\/h2>\n\n\n--><\/p>\n<hr class=\"orange\">\n<section>\n<div class=\"bg-wh text-align-left\">\n<p>To secure the reliability of electronic components such as semiconductor and sensors, aging tests with current applied are conducted on the devices. Such tests require highly stable voltage sources. In some tests, the normal operating range of the devices is verified by changing the supply voltage. With its low noise, high stability and high sourcing resolution, the 6146\/6156 offers high reliability in these tests.\n<\/p>\n<\/p><\/div>\n<\/section>\n<p>\t<img decoding=\"async\" class=\"mb50\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/ADC-APPLICATION-ELECTRONIC-COMPONENTS.jpg\" style=\"margin-top: 50px; margin-bottom: 20px;width:50%;\"><\/p>\n<\/div>\n<\/section>\n<p><!--\n\n\n<h2>Features<\/h2>\n\n\n\n\n<hr class=\"orange\">\n\n\n<section>\n\t\n\n<div class=\"bg-wh text-align-left\">\n\t\n\n<p>\u25a0Advantages of the open clean system KOACH\u2028<\/p>\n\n\n\n\n<p>\u2460Low cost \u2461 Can be used immediately after installation\u2462 Energy saving<\/br> \u2463 Clean-up in 30 seconds to a few minutes after switching on\u2028<\/p>\n\n\n\n\n<p>\u25a0 Advantages of Table Coach: tabletop, portable, most appropriate for laboratories and testing rooms.<\/p>\n\n \n\n<p>Cleanliness: ISO1 class. Total ventilating duration 110 seconds (set wind speed: 0.4m\/sec)<\/p>\n\n\n\n\n<p>\u25a0 Advantages of Stand Coach: No need for laborious and costly works, easy movement with wheels, side-by-side  & face-to-face operation possible, no need of surrounding, good workability. Cleanliness: ISO1 class. Total ventilation duration 105 seconds.\n<\/p>\n\n\n\t\n\t<\/div>\n\n\n\t<\/section>\n\n\n\n\n\n<h2>Application<\/h2>\n\n\n\n\n<hr class=\"orange\">\n\n\n<section>\n\t\n\n<div class=\"bg-wh text-align-left\">\n\t\n\n<p>\u25a0Semiconductors (basic processes & assembly processes), precision equipment, solar cells, batteries, etc.\n<\/p>\n\n\n\n\n<p>\u25a0 Laptop PCs, smartphones, memory of wearable terminal PCs, diodes, CPU, touch panels, power devices, tablets, etc.\n<\/p>\n\n\n\t\n\n<p class=\"mt50\">\n\n\n\t<\/div>\n\n\n\t<\/section>\n\n\n\n--><\/p>\n<!--\u30b3\u30f3\u30c6\u30f3\u30c4\uff13\u3053\u3053\u304b\u3089-->\n<section class=\"post-content\">\n<h2>Product Details<\/h2>\n<hr class=\"orange\">\n<div class=\"flex-container mt100\">\n<div class=\"flex-items\">\n<div align=\"center\">\n<div class=\"item-img\"><img decoding=\"async\" src=\"https:\/\/www.n-denkei.com\/wp-content\/uploads\/adc-6156.png\"><\/div>\n<\/div>\n<div class=\"item\">\n<p>DC Voltage Current Source<br \/>\n6146 \/ 6156<\/p>\n<p><a class=\"btn-find-out-more\" href=\"https:\/\/www.n-denkei.com\/philippines\/items\/product\/adcmt-dc-voltage-current-source-6146-6156\/\n\">find out more<i class=\"fa fa-angle-right\"><\/i><\/a><\/div>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>\u3000\u3000 Reliability test of semiconductors and electronic components To secure the reliability of electronic components such as semiconductor and sensors, aging tests with current applied are conducted on the devices. Such tests require highly stable voltage sources. In some tests, the normal operating range of the devices is verified by changing the supply voltage. With\u2026<\/p>\n","protected":false},"author":65,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"freepage.php","meta":{"_mi_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0},"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/pages\/2625"}],"collection":[{"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/users\/65"}],"replies":[{"embeddable":true,"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/comments?post=2625"}],"version-history":[{"count":3,"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/pages\/2625\/revisions"}],"predecessor-version":[{"id":2658,"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/pages\/2625\/revisions\/2658"}],"wp:attachment":[{"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/media?parent=2625"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}