{"id":2606,"date":"2023-04-01T11:24:54","date_gmt":"2023-04-01T02:24:54","guid":{"rendered":"https:\/\/www.n-denkei.com\/philippines\/?page_id=2606"},"modified":"2023-06-05T11:37:57","modified_gmt":"2023-06-05T02:37:57","slug":"solution-and-application-semiconductor","status":"publish","type":"page","link":"https:\/\/www.n-denkei.com\/philippines\/solution-and-application-semiconductor\/","title":{"rendered":"Solution and Application Semiconductor"},"content":{"rendered":"<div align=\"center\">\n<div style=\"width:70%;\"><!--kim \u4e0a\u90e8\u753b\u50cf\u3068\u696d\u754c\u5206\u91ce--><\/p>\n<section id=\"mainimg\" style=\"margin-top: 0px\">\u3000\u3000<br \/>\n<img decoding=\"async\" loading=\"lazy\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/image_adobe_express-8.jpeg\" alt=\"\" width=\"100%\" height=\"auto\" \/><\/p>\n<div class=\"mainTit01Wrap\">\n<div class=\"mainTit01\">\n<div class=\"mainTit01In\">\n<p class=\"subTit type01\" style=\"font-size:3vw;\">Semiconductor<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<p><!--kim\u3000\u4e0a\u90e8\u753b\u50cf\u3068\u696d\u754c\u5206\u91ce--><\/p>\n<section>\n<!--kim\u3000\uff11\u30bd\u30ea\u30e5\u30fc\u30b7\u30e7\u30f3\u30b3\u30f3\u30c6\u30f3\u30c4\u958b\u59cb--><\/p>\n<div style=\"margin-top:30px;background-color:#DCD3F9;height:210px;\" class=\"aa\">\n<a href=\"https:\/\/www.n-denkei.com\/philippines\/reliability-test-of-semiconductors-and-electronic-components\/\" target=\"_blank\" rel=\"noopener\"><\/p>\n<table class=\"ss\">\n<tbody>\n<tr>\n<td style=\"vertical-align : middle; text-align:center;width:28%;min-width:150px;height:210px;\">\n<img decoding=\"async\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/ADC-APPLICATION-ELECTRONIC-COMPONENTS.jpg\"  \/>\n<\/td>\n<td style=\" vertical-align : middle;\"><strong>Reliability test of semiconductors and electronic components<\/strong>\n<\/td>\n<tr>\n<\/tbody>\n<\/table>\n<p><\/a>\n<\/div>\n<p><!--kim\u3000\uff11\u30bd\u30ea\u30e5\u30fc\u30b7\u30e7\u30f3\u30b3\u30f3\u30c6\u30f3\u30c4\u7d42\u4e86--><\/p>\n<p><!--kim\u3000\uff11\u30bd\u30ea\u30e5\u30fc\u30b7\u30e7\u30f3\u30b3\u30f3\u30c6\u30f3\u30c4\u958b\u59cb--><\/p>\n<div style=\"margin-top:30px;background-color:#DCD3F9;height:210px;\" class=\"aa\">\n<a href=\"https:\/\/www.n-denkei.com\/philippines\/semiconductor-temperature-characteristic-test\/\" target=\"_blank\" rel=\"noopener\"><\/p>\n<table class=\"ss\">\n<tbody>\n<tr>\n<td style=\"vertical-align : middle; text-align:center;width:28%;min-width:150px;height:210px;\">\n<img decoding=\"async\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/%E3%82%B9%E3%82%AF%E3%83%AA%E3%83%BC%E3%83%B3%E3%82%B7%E3%83%A7%E3%83%83%E3%83%88-2023-03-28-12.05.53.png\"  \/>\n<\/td>\n<td style=\" vertical-align : middle;\"><strong>Semiconductor temperature<br \/>\ncharacteristic test<\/strong>\n<\/td>\n<tr>\n<\/tbody>\n<\/table>\n<p><\/a>\n<\/div>\n<p><!--kim\u3000\uff11\u30bd\u30ea\u30e5\u30fc\u30b7\u30e7\u30f3\u30b3\u30f3\u30c6\u30f3\u30c4\u7d42\u4e86--><\/p>\n<p><!--kim\u3000\uff11\u30bd\u30ea\u30e5\u30fc\u30b7\u30e7\u30f3\u30b3\u30f3\u30c6\u30f3\u30c4\u958b\u59cb--><\/p>\n<div style=\"margin-top:30px;background-color:#DCD3F9;height:210px;\" class=\"aa\">\n<a href=\"https:https:\/\/www.n-denkei.com\/philippines\/dust-free-environment-for-the-environment-of-semiconductor-manufacturing\/\" target=\"_blank\" rel=\"noopener\"><\/p>\n<table class=\"ss\">\n<tbody>\n<tr>\n<td style=\"vertical-align : middle; text-align:center;width:28%;min-width:150px;;height:210px;\">\n<img decoding=\"async\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/%E3%82%B9%E3%82%AF%E3%83%AA%E3%83%BC%E3%83%B3%E3%82%B7%E3%83%A7%E3%83%83%E3%83%88-2023-03-30-15.02.28.png\"  \/>\n<\/td>\n<td style=\" vertical-align : middle;\"><strong>Dust-free environment for the environment of semiconductor manufacturing<\/strong>\n<\/td>\n<tr>\n<\/tbody>\n<\/table>\n<p><\/a>\n<\/div>\n<p><!--kim\u3000\uff11\u30bd\u30ea\u30e5\u30fc\u30b7\u30e7\u30f3\u30b3\u30f3\u30c6\u30f3\u30c4\u7d42\u4e86--><\/p>\n<\/section\n\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>\u3000\u3000 Semiconductor Reliability test of semiconductors and electronic components Semiconductor temperature characteristic test Dust-free environment for the environment of semiconductor manufacturing<\/p>\n","protected":false},"author":58,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"freepage.php","meta":{"_mi_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0},"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/pages\/2606"}],"collection":[{"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/users\/58"}],"replies":[{"embeddable":true,"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/comments?post=2606"}],"version-history":[{"count":5,"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/pages\/2606\/revisions"}],"predecessor-version":[{"id":2833,"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/pages\/2606\/revisions\/2833"}],"wp:attachment":[{"href":"https:\/\/www.n-denkei.com\/philippines\/wp-json\/wp\/v2\/media?parent=2606"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}