{"id":2571,"date":"2023-03-31T17:52:30","date_gmt":"2023-03-31T08:52:30","guid":{"rendered":"https:\/\/www.n-denkei.com\/malaysia\/?page_id=2571"},"modified":"2023-04-01T22:49:39","modified_gmt":"2023-04-01T13:49:39","slug":"reliability-test-of-semiconductors-and-electronic-components","status":"publish","type":"page","link":"https:\/\/www.n-denkei.com\/malaysia\/reliability-test-of-semiconductors-and-electronic-components\/","title":{"rendered":"Reliability test of semiconductors and electronic components"},"content":{"rendered":"<link rel=\"stylesheet\" type=\"text\/css\" href=\"\/css\/philippines\/hioki_202109.css\" media=\"all\">\n<div align=\"center\">\n<div class=\"section_container\" style=\"\n    margin-top: 0px;width:70%;\"><br \/>\n<!--kim\u8ffd\u52a0\u90e8\u5206--><\/p>\n<section id=\"mainimg\" style=\"margin-top: 0px\">\u3000\u3000<br \/>\n<img decoding=\"async\" loading=\"lazy\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/\u30b9\u30af\u30ea\u30fc\u30f3\u30b7\u30e7\u30c3\u30c8-2023-03-28-13.56.36.png\" alt=\"\" width=\"100%\" height=\"auto\" \/><\/p>\n<div class=\"mainTit01Wrap\">\n<div class=\"mainTit01\">\n<div class=\"mainTit01In\">\n<p class=\"subTit type01\">Reliability test of semiconductors and electronic components<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<p><!--kim\u8ffd\u52a0\u90e8\u5206--><\/p>\n<section>\n<div class=\"bg-wh\">\n<!--\n\n\n<h2>Summary Description<\/h2>\n\n\n--><\/p>\n<hr class=\"orange\">\n<section>\n<div class=\"bg-wh text-align-left\">\n<p>To secure the reliability of electronic components such as semiconductor and sensors, aging tests with current applied are conducted on the devices. Such tests require highly stable voltage sources. In some tests, the normal operating range of the devices is verified by changing the supply voltage. With its low noise, high stability and high sourcing resolution, the 6146\/6156 offers high reliability in these tests.\n<\/p>\n<\/p><\/div>\n<\/section>\n<p>\t<img decoding=\"async\" class=\"mb50\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/ADC-APPLICATION-ELECTRONIC-COMPONENTS.jpg\" style=\"margin-top: 50px; margin-bottom: 20px;width:50%;\"><\/p>\n<\/div>\n<\/section>\n<!--\u30b3\u30f3\u30c6\u30f3\u30c4\uff13\u3053\u3053\u304b\u3089-->\n<section class=\"post-content\">\n<h2>Product Details<\/h2>\n<hr class=\"orange\">\n<div class=\"flex-container mt100\">\n<div class=\"flex-items\">\n<div align=\"center\">\n<div class=\"item-img\"><img decoding=\"async\" src=\"https:\/\/www.n-denkei.com\/wp-content\/uploads\/adc-6156.png\"><\/div>\n<\/div>\n<div class=\"item\">\n<p>DC Voltage Current Source<br \/>\n6146 \/ 6156<\/p>\n<p><a class=\"btn-find-out-more\" href=\"https:\/\/www.n-denkei.com\/malaysia\/items\/product\/adcmt-dc-voltage-current-source-6146-6156\/\n\">find out more<i class=\"fa fa-angle-right\"><\/i><\/a><\/div>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>\u3000\u3000 Reliability test of semiconductors and electronic components To secure the reliability of electronic components such as semiconductor and sensors, aging tests with current applied are conducted on the devices. Such tests require highly stable voltage sources. In some tests, the normal operating range of the devices is verified by changing the supply voltage. With\u2026<\/p>\n","protected":false},"author":65,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"freepage.php","meta":{"_mi_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0},"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.n-denkei.com\/malaysia\/wp-json\/wp\/v2\/pages\/2571"}],"collection":[{"href":"https:\/\/www.n-denkei.com\/malaysia\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.n-denkei.com\/malaysia\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.n-denkei.com\/malaysia\/wp-json\/wp\/v2\/users\/65"}],"replies":[{"embeddable":true,"href":"https:\/\/www.n-denkei.com\/malaysia\/wp-json\/wp\/v2\/comments?post=2571"}],"version-history":[{"count":5,"href":"https:\/\/www.n-denkei.com\/malaysia\/wp-json\/wp\/v2\/pages\/2571\/revisions"}],"predecessor-version":[{"id":2617,"href":"https:\/\/www.n-denkei.com\/malaysia\/wp-json\/wp\/v2\/pages\/2571\/revisions\/2617"}],"wp:attachment":[{"href":"https:\/\/www.n-denkei.com\/malaysia\/wp-json\/wp\/v2\/media?parent=2571"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}