{"id":2770,"date":"2023-04-01T23:46:54","date_gmt":"2023-04-01T14:46:54","guid":{"rendered":"https:\/\/www.n-denkei.com\/india\/?page_id=2770"},"modified":"2023-04-01T23:49:08","modified_gmt":"2023-04-01T14:49:08","slug":"diode-temperature-dependence-evaluation-and-leak-current-measurement","status":"publish","type":"page","link":"https:\/\/www.n-denkei.com\/india\/diode-temperature-dependence-evaluation-and-leak-current-measurement\/","title":{"rendered":"Diode temperature dependence evaluation and leak current measurement"},"content":{"rendered":"<link rel=\"stylesheet\" type=\"text\/css\" href=\"\/css\/philippines\/hioki_202109.css\" media=\"all\">\n<div align=\"center\">\n<div class=\"section_container\" style=\"\n    margin-top: 0px;width:70%;\"><br \/>\n<!--kim\u8ffd\u52a0\u90e8\u5206--><\/p>\n<section id=\"mainimg\" style=\"margin-top: 0px\">\u3000\u3000<br \/>\n<img decoding=\"async\" loading=\"lazy\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/\u30b9\u30af\u30ea\u30fc\u30f3\u30b7\u30e7\u30c3\u30c8-2023-03-28-13.56.36.png\" alt=\"\" width=\"100%\" height=\"auto\" \/><\/p>\n<div class=\"mainTit01Wrap\">\n<div class=\"mainTit01\">\n<div class=\"mainTit01In\">\n<p class=\"subTit type01\">Diode temperature dependence evaluation and leak current measurement<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<p><!--kim\u8ffd\u52a0\u90e8\u5206--><\/p>\n<section>\n<div class=\"bg-wh\">\n<!--\n\n\n<h2>Summary Description<\/h2>\n\n\n--><\/p>\n<hr class=\"orange\">\n<section>\n<div class=\"bg-wh text-align-left\">\n<p>In I-V characteristic test on devices that generate heat when current flows, applying pulse current is effective for avoiding the influence of the self-heating. By using the current pulse sweep function and voltage measurement in synchronous with pulses, precise VF characteristic test with large current is available.<br \/>\nThe 6247C\/6247G is capable of ISVM (current source voltage measurement) and VSIM (voltage source current measurement). Diode I-V characteristics are measured by ISVM. In addition, micro leak current up to 10 pA can be measured by applying reverse voltage to diodes by VSIM. Also, automatic PASS\/FAIL judgment is available by using comparison operation of the measurement calculating function.<\/p>\n<\/p><\/div>\n<\/section>\n<p>\t<img decoding=\"async\" class=\"mb50\" src=\"https:\/\/www.n-denkei.com\/media\/wp-content\/uploads\/sites\/13\/ADC-APPLICATION-DIODE-VF-EVALUATION01.jpg\" style=\"margin-top: 50px; margin-bottom: 20px;width:50%;\"><\/p>\n<\/div>\n<\/section>\n<p><!--\n\n\n<h2>Features<\/h2>\n\n\n\n\n<hr class=\"orange\">\n\n\n<section>\n\t\n\n<div class=\"bg-wh text-align-left\">\n\t\n\n<p>\u25a0Advantages of the open clean system KOACH\u2028<\/p>\n\n\n\n\n<p>\u2460Low cost \u2461 Can be used immediately after installation\u2462 Energy saving<\/br> \u2463 Clean-up in 30 seconds to a few minutes after switching on\u2028<\/p>\n\n\n\n\n<p>\u25a0 Advantages of Table Coach: tabletop, portable, most appropriate for laboratories and testing rooms.<\/p>\n\n \n\n<p>Cleanliness: ISO1 class. Total ventilating duration 110 seconds (set wind speed: 0.4m\/sec)<\/p>\n\n\n\n\n<p>\u25a0 Advantages of Stand Coach: No need for laborious and costly works, easy movement with wheels, side-by-side  & face-to-face operation possible, no need of surrounding, good workability. Cleanliness: ISO1 class. Total ventilation duration 105 seconds.\n<\/p>\n\n\n\t\n\t<\/div>\n\n\n\t<\/section>\n\n\n\n\n\n<h2>Application<\/h2>\n\n\n\n\n<hr class=\"orange\">\n\n\n<section>\n\t\n\n<div class=\"bg-wh text-align-left\">\n\t\n\n<p>\u25a0Semiconductors (basic processes & assembly processes), precision equipment, solar cells, batteries, etc.\n<\/p>\n\n\n\n\n<p>\u25a0 Laptop PCs, smartphones, memory of wearable terminal PCs, diodes, CPU, touch panels, power devices, tablets, etc.\n<\/p>\n\n\n\t\n\n<p class=\"mt50\">\n\n\n\t<\/div>\n\n\n\t<\/section>\n\n\n\n--><\/p>\n<!--\u30b3\u30f3\u30c6\u30f3\u30c4\uff13\u3053\u3053\u304b\u3089-->\n<section class=\"post-content\">\n<h2>Product Details<\/h2>\n<hr class=\"orange\">\n<div class=\"flex-container mt100\">\n<div class=\"flex-items\">\n<div align=\"center\">\n<div class=\"item-img\"><img decoding=\"async\" src=\"https:\/\/www.n-denkei.com\/wp-content\/uploads\/adc-6240b.png\"><\/div>\n<\/div>\n<div class=\"item\">\n<p>DC Voltage Current Source\/Monitor<br \/>\n6240B<\/p>\n<p><a class=\"btn-find-out-more\" href=\"https:\/\/www.n-denkei.com\/india\/items\/product\/adcmt-dc-voltage-current-source-monitor-6240b\/\n\">find out more<i class=\"fa fa-angle-right\"><\/i><\/a><\/div>\n<\/div>\n<div class=\"flex-items\">\n<div align=\"center\">\n<div class=\"item-img\"><img decoding=\"async\" src=\"https:\/\/www.n-denkei.com\/wp-content\/uploads\/adc-6247g.png\"><\/div>\n<\/div>\n<div class=\"item\">\n<p>DC Voltage Current Source\/Monitor<br \/>\n6247C \/ 6247G<\/p>\n<p><a class=\"btn-find-out-more\" href=\"https:\/\/www.n-denkei.com\/india\/items\/product\/adcmt-dc-voltage-current-source-monitor-6247c-6247g\/\n\">find out more<i class=\"fa fa-angle-right\"><\/i><\/a><\/div>\n<\/div>\n<div class=\"flex-items\">\n<div align=\"center\">\n<div class=\"item-img\"><img decoding=\"async\" src=\"https:\/\/www.n-denkei.com\/wp-content\/uploads\/adc-6253-1.png\"><\/div>\n<\/div>\n<div class=\"item\">\n<p>DC Voltage Current Source\/Monitor<br \/>\n6253<\/p>\n<p><a class=\"btn-find-out-more\" href=\"https:\/\/www.n-denkei.com\/india\/items\/product\/adcmt-dc-voltage-current-source-monitor-6253\/\n\">find out more<i class=\"fa fa-angle-right\"><\/i><\/a><\/div>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>\u3000\u3000 Diode temperature dependence evaluation and leak current measurement In I-V characteristic test on devices that generate heat when current flows, applying pulse current is effective for avoiding the influence of the self-heating. By using the current pulse sweep function and voltage measurement in synchronous with pulses, precise VF characteristic test with large current is\u2026<\/p>\n","protected":false},"author":58,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"freepage.php","meta":{"_mi_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0},"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.n-denkei.com\/india\/wp-json\/wp\/v2\/pages\/2770"}],"collection":[{"href":"https:\/\/www.n-denkei.com\/india\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.n-denkei.com\/india\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.n-denkei.com\/india\/wp-json\/wp\/v2\/users\/58"}],"replies":[{"embeddable":true,"href":"https:\/\/www.n-denkei.com\/india\/wp-json\/wp\/v2\/comments?post=2770"}],"version-history":[{"count":3,"href":"https:\/\/www.n-denkei.com\/india\/wp-json\/wp\/v2\/pages\/2770\/revisions"}],"predecessor-version":[{"id":2772,"href":"https:\/\/www.n-denkei.com\/india\/wp-json\/wp\/v2\/pages\/2770\/revisions\/2772"}],"wp:attachment":[{"href":"https:\/\/www.n-denkei.com\/india\/wp-json\/wp\/v2\/media?parent=2770"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}